surface measurements by AFM (contact + intermittent contact)/ Lateral Force Microscopy / Magnetic Force Microscopy/ Electrostatic Force Microscopy / Scanning Capacitance Force Microscopy/ Kelvin Probe Force Microscopy / Piezoresponse Force Microscopy/ Spreading-Resistance Imaging / STM, samples up to 20 mm, range up to 3x3x2,6 um