X-ray diffractometer for the study of thin layers (X-ray diffraction, X-ray reflectivity), or elastic stress analysis
Read morex-ray diffractometer for thin films
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powder x-ray diffractometer
X-ray diffractometer for studying the structure of substances; position-sensitive detector or proportional detector available; Anton Paar HTK 1200N high-temperature chamber (up to 1200oC) can be used; samples can also be measured in a capillary or… Continue Reading powder x-ray diffractometer
Read moreLINKAM-cooling chamber
Enables controlled heating and cooling of samples Observation of crystallization processes, temperature-dependent structural changes, temperature-influenced mechanical experiments and similar Temperature range of -40 to + 150°C.
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