Lecture: Plasma methods for nanolayers and X-ray analytics

Responsible lecturer doc. Ing. Martin Kormunda, Ph.D.
Lecturers: doc. Ing. Martin Kormunda, Ph.D., doc. RNDr. Stanislav Daniš, Ph.D.

Semester: Winter Semester, Compulsory elective course with 2 credits

Online-Lecture: Mondays 11.11. – 16.12.24, 15.00 -16.30

Practical courses: 27.1. and 28.1.25
Capacity: 4 students

Condition: practical courses are compulsory

Registration via Opal: Plasma Methods for Nanolayers and X-ray Analytics – OPAL (sachsen.de)


The first part of the lectures is aimed at getting to know the physics of plasma so that it is possible to apply this knowledge to the issues of use in material engineering and analytical methods. The second part is focused on X-ray methods suitable for the analysis of layers and surfaces, diffraction methods and photoelectron spectroscopy.


Content:

In the lectures, interesting plasma discharges (environments) from low pressure to atmospheric, including typical problems and applications, are discussed. In other words, plasma generation methods using direct, alternating and pulsed voltages and currents.

Special emphasis is placed on the interaction of charged particles with surfaces under conditions typical of the mentioned discharges (plasma chemistry, particle deposition, sputtering, implantation, etc.).

Teaching analytical methods for thin layers and surfaces will focus on mastering the basic principles of X-ray diffraction and photoelectron spectroscopy.

Part of the lecture will also be an introduction to the relevant experimental equipment and an introduction to the physics and technology of low pressures.

Photoelectron spectroscopy will be demonstrated as a method of qualitative and quantitative surface analysis, including a discussion of principle limitations.

The part of the lecture concerning x-ray diffraction will be devoted to the basic of crystallography and scattering of x-ray on ordered atoms. Elementary evaluation of scattering data – determination of lattice parameters, qualitative analysis of the sample composition, resolving the thickness of thin film – from laboratory diffractometers will be shown.


Practical teaching

Practical teaching will take place in blocks divided into:

  • Plasma technology
  • X-ray diffraction
  • X-ray photoelectron spectroscopy

Date of event

DateRealizationContentLecturers
11.11.   
15 – 16:30 
onlineLow Pressure Plasma Processes and Applications  – Part 1 doc. Kormunda
18.11.   
15 – 16:30 
onlineLow Pressure Plasma Processes and Applications  – Part 2doc. Kormunda
25.11.   
15 – 16:30 
onlineLow Pressure Plasma Processes and Applications  – Part 3doc. Kormunda
2.12.     
15 – 16:30 
onlineLow Pressure Plasma Processes and Applications  – Part 4doc. Kormunda
9.12.     
15 – 16:30 
onlineLow Pressure Plasma Processes and Applications  – Part 4doc. Kormunda
16.12.   
15 – 16:30 
onlineX-ray photoelectron spectroscopy for material science doc. Kormunda
27.1. 
9 – 16:30 
practiseLow Pressure Plasma Processes and Applications – practise doc. Kormunda
28.1.   
9 – 10:30 
liveX-ray diffraction for material science – lecturedoc. Daniš
28.1.   
11 – 12:30 
practiseX-ray diffraction for material science doc. Daniš
28.1.   
14 – 15:30 
practiseX-ray photoelectron spectroscopy for material sciencedoc. Kormunda